Dr. Shawn D. McGrane Profile

Dr. Shawn D. McGrane

at Los Alamos National Lab

SPIE Involvement:

Author

Publications (7)

Proceedings Article | 7 May 2012 Paper

Optimal coherent control methods for explosives detection

D. Moore, S. McGrane, M. Greenfield, R. J. Scharff

Proceedings Volume 8373, 83732B (2012) https://doi.org/10.1117/12.920944

KEYWORDS: Explosives, Explosives detection, Raman spectroscopy, Detection and tracking algorithms, Pulsed laser operation, Molecules, Spatial light modulators, Spectroscopy, Femtosecond phenomena, Molecular lasers

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Proceedings Article | 4 June 2011 Paper

Optimal dynamic detection of explosives

D. Moore, Herschel Rabitz, S. McGrane, M. Greenfield, R. J. Scharff, R. Chalmers, J. Roslund

Proceedings Volume 8018, 80181D (2011) https://doi.org/10.1117/12.882963

KEYWORDS: Explosives, Explosives detection, Raman spectroscopy, Detection and tracking algorithms, Molecules, Pulsed laser operation, Molecular lasers, Spectroscopy, Femtosecond phenomena, Spatial light modulators

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Proceedings Article | 8 May 2009 Paper

Optimal dynamic detection of explosives

D. Moore, Herschel Rabitz, S. McGrane, M. Greenfield, R. Scharff, V. Beltrani, J. Roslund

Proceedings Volume 7304, 730413 (2009) https://doi.org/10.1117/12.818671

KEYWORDS: Signal detection, Spectroscopy, Laser applications, Signal to noise ratio, Ultrafast lasers, Molecular lasers, Molecules, Pulsed laser operation, Explosives detection, Explosives

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Proceedings Article | 12 May 2008 Paper

Ultrafast dynamic ellipsometry of laser ablated silicon

C. Bolme, S. McGrane, D. Moore, D. Funk

Proceedings Volume 7005, 70050M (2008) https://doi.org/10.1117/12.782739

KEYWORDS: Refractive index, Reflectivity, Silicon, Phase shifts, Ultrafast phenomena, Ellipsometry, Laser ablation, Semiconductor lasers, Spectroscopy, Pulsed laser operation

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Proceedings Article | 7 June 2006 Paper

Single pulse ultrafast dynamic ellipsometry

David Moore, Cynthia Bolme, Shawn McGrane, David Funk

Proceedings Volume 6261, 626105 (2006) https://doi.org/10.1117/12.674782

KEYWORDS: Interferometry, Ellipsometry, CCD cameras, Spectroscopy, Phase measurement, Charge-coupled devices, Ultrafast phenomena, Dielectrics, Dielectric polarization, Thin films

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Proceedings Article | 20 September 2004 Paper

Time-resolved ultrafast spatial interferometric analysis of femtosecond laser-metal interactions

David Funk, David Moore, Shawn McGrane, J. Reho, R. Rabie

Proceedings Volume 5448, (2004) https://doi.org/10.1117/12.548511

KEYWORDS: Reflectivity, Aluminum, Gold, Refraction, Phase shifts, Interfaces, Gallium, Interferometry, Solids, Metals

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Proceedings Article | 20 September 2004 Paper

Ultrafast spectroscopy and interferometry of laser-shocked thin films: practical considerations

Shawn McGrane, David Moore, David Funk

Proceedings Volume 5448, (2004) https://doi.org/10.1117/12.547966

KEYWORDS: Chemical reactions, Refractive index, Beam shaping, Absorption, Infrared radiation, Aluminum, Picosecond phenomena, Spectroscopy, Interferometry, Thin films

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Showing 5 of 7 publications

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