Dr. Simon Dold Profile

Dr. Simon Dold

at European XFEL GmbH

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Publications (1)

Proceedings Article | 6 June 2023 Presentation

Extending the ablation imprints method of focal spot characterisation from X-ray to visible and near-infrared spectral range (Conference Presentation)

Šimon Jelínek, Tomáš Burian, Jan Dostál, Roman Dudžák, Věra Hájková, Libor Juha, Michal Krupka, Zuzana Kuglerová, Thomas Baumann, Simon Dold, Tommaso Mazza, Yevheniy Ovcharenko, Sergey Usenko, Michael Meyer, Jaromír Chalupský

Proceedings Volume 12578, 125780B (2023) https://doi.org/10.1117/12.2670501

KEYWORDS: Laser ablation, Visible radiation, X-rays, X-ray characterization, Quantum systems, Laser damage threshold, Ablation, Pulsed laser operation, Laser systems engineering, Laser radiation

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