Sourabh Hemant Thakare
at Univ of Texas at Arlington
SPIE Involvement:
Author
Publications (1)

Proceedings Article | 22 April 2020 Paper
Proceedings Volume 11377, 113771D (2020) https://doi.org/10.1117/12.2559112
KEYWORDS: Scanning electron microscopy, Additive manufacturing, Computer aided design, Statistical analysis, Polishing, Manufacturing, Metals, X-ray diffraction, Surface finishing

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