Dr. Stefan Krey Profile

Dr. Stefan Krey

Managing Director (CTO) at TRIOPTICS GmbH

SPIE Involvement:

Author

Publications (18)

Proceedings Article | 8 March 2014 Paper

Measuring the refractive index with precision goniometers: a comparative study

Stefan Krey, Dennis Off, Aiko Ruprecht

Proceedings Volume 8992, 89920D (2014) https://doi.org/10.1117/12.2041760

KEYWORDS: Prisms, Refractive index, Telescopes, Autocollimation, Spectroscopy, Autocollimators, Glasses, Error analysis, Collimators, Lamps

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Proceedings Article | 8 March 2014 Paper

Automated assembly of camera modules using active alignment with up to six degrees of freedom

K. Bräuniger, D. Stickler, D. Winters, C. Volmer, M. Jahn, S. Krey

Proceedings Volume 8992, 89920F (2014) https://doi.org/10.1117/12.2041754

KEYWORDS: Modulation transfer functions, Cameras, Sensors, Image sensors, Collimators, Spatial frequencies, Imaging systems, Reticles, Objectives, Image processing

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Proceedings Article | 7 February 2012 Paper

Surface topography and optical performance measurement of microlenses used in high power VCSEL systems

I. Erichsen, S. Krey

Proceedings Volume 8276, 82760C (2012) https://doi.org/10.1117/12.908130

KEYWORDS: Wavefronts, Microlens, Wavefront sensors, Lenses, Sensors, Vertical cavity surface emitting lasers, Microlens array, Reflection, Optics manufacturing, Optical properties

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Proceedings Article | 15 February 2011 Paper

Automated measurement of centering errors and relative surface distances for the optimized assembly of micro-optics

Patrik Langehanenberg, Eugen Dumitrescu, Josef Heinisch, Stefan Krey, Aiko Ruprecht

Proceedings Volume 7926, 79260E (2011) https://doi.org/10.1117/12.874628

KEYWORDS: Interferometers, Imaging systems, Autocollimators, Error analysis, Objectives, Optical components, Cell phones, Optical alignment, Optics manufacturing, Refractive index

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Proceedings Article | 14 May 2010 Paper

Simple methods for alignment of line distance sensor arrays

H. Bremer, F. Schmähling, C. Elster, S. Krey, A. Ruprecht, M. Schulz, M. Stavridis, A. Wiegmann

Proceedings Volume 7718, 77181M (2010) https://doi.org/10.1117/12.854266

KEYWORDS: Sensors, CCD image sensors, Distance measurement, CCD cameras, Optical arrays, Colorimetry, Microscopes, Charge-coupled devices, Optical sensors, Distortion

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Proceedings Article | 14 May 2010 Paper

A deflectometric sensor for the on-machine surface form measurement and adaptive manufacturing

Stefan Krey, Iris Erichsen, Ilka Mahns, Wim van Amstel, Karl Vielhaber

Proceedings Volume 7718, 77180C (2010) https://doi.org/10.1117/12.854643

KEYWORDS: Sensors, Manufacturing, Aspheric lenses, Spherical lenses, Optical spheres, Deflectometry, Error analysis, Optics manufacturing, Kinematics, Reconstruction algorithms

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Proceedings Article | 24 February 2010 Paper

Characterization of intraocular lenses: a comparison of different measurement methods

M. Cherrier, I. Erichsen, S. Krey

Proceedings Volume 7556, 75560W (2010) https://doi.org/10.1117/12.843665

KEYWORDS: Modulation transfer functions, Wavefronts, Eye, Eye models, Monochromatic aberrations, Cornea, Intraocular lenses, Wavefront sensors, CCD cameras, Point spread functions

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Proceedings Article | 29 August 2008 Paper

High resolution wavefront measurement of aspheric optics

I. Erichsen, S. Krey, J. Heinisch, A. Ruprecht, E. Dumitrescu

Proceedings Volume 7060, 70600T (2008) https://doi.org/10.1117/12.794467

KEYWORDS: Wavefronts, Semiconducting wafers, Wavefront sensors, Sensors, Light sources, Optical testing, Modulation transfer functions, Wafer-level optics, Aspheric optics, Aspheric lenses

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Proceedings Article | 25 April 2008 Paper

Ultra-fast wavefront analyser for high volume production of camera modules lenses

M. Cherrier, I. Erichsen, A. Ruprecht, S. Krey

Proceedings Volume 6995, 699512 (2008) https://doi.org/10.1117/12.781433

KEYWORDS: Semiconducting wafers, Wavefronts, Lenses, Sensors, Wavefront sensors, Objectives, Telescopes, Light sources, Microscopes, Modulation transfer functions

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