Prof. Stefan J. Rinner Profile

Prof. Stefan J. Rinner

at OST

SPIE Involvement:

Author

Publications (9)

SPIE Journal Paper | 31 March 2021

Enhancing the performance of light field camera by pattern projection

Silvan Ammann, Gilson Orlando, Joerg Pierer, Carsten Ziolek, Stefan Rinner

OE, Vol. 60, Issue 03, 034113, (March 2021) https://doi.org/10.1117/12.10.1117/1.OE.60.3.034113

KEYWORDS: Cameras, Optical spheres, Beam splitters, Optical engineering, Specular reflections, Projection systems, Calibration, 3D metrology, Sensors, Image sensors

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Proceedings Article | 21 June 2019 Presentation + Paper

Innovative system for automated measurement of the distribution of the length of natural fibres

Stefan Rinner, Michael Kahl, Carsten Ziolek, Hubert Schmid

Proceedings Volume 11056, 110561Z (2019) https://doi.org/10.1117/12.2527438

KEYWORDS: Cameras, Spectral resolution, Scanners, Silver, Sensors, Applied sciences, Seaborgium, Image processing, Dielectrics, Operating systems

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Proceedings Article | 13 November 2017 Paper

Influence of temperature and environment on the laser damage threshold of ion-beam sputtered anti-reflective coatings at 355 nm wavelength

Roelene Botha, Thomas Gischkat, Igor Stevanovic, Andreas Bächli, David Bischof, Markus Michler, Stefan Rinner, Carsten Ziolek

Proceedings Volume 10447, 104472B (2017) https://doi.org/10.1117/12.2281176

KEYWORDS: Coating, Laser damage threshold, Ion beams, Antireflective coatings, Humidity, Laser induced damage

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Proceedings Article | 6 December 2016 Paper

Investigation of the ageing effects exhibited by AR coatings exposed to ultraviolet laser irradiation

Roelene Botha, David Bischof, Bernhard Vetsch, Ueli Scherrer, Markus Michler, Stefan Rinner, Andreas Ettemeyer, Carsten Ziolek

Proceedings Volume 10014, 100141L (2016) https://doi.org/10.1117/12.2244657

KEYWORDS: Antireflective coatings, Laser induced damage, Optical coatings, Ultraviolet radiation, Optical testing, Optical components, Laser damage threshold, Silica, Laser irradiation, Temperature metrology

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Proceedings Article | 11 November 2016 Paper

Effect of finite dimensions of diffraction grating to Talbot imaging

Petr Pokorný, Antonín Mikš, Jiří Novák, Pavel Novák, Stefan Rinner

Proceedings Volume 10151, 1015112 (2016) https://doi.org/10.1117/12.2256500

KEYWORDS: Diffraction gratings, Diffraction, Spherical lenses, Wave propagation, Wavefronts, Light wave propagation, Optical testing, Optics manufacturing, Ronchi rulings, Transparency

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Proceedings Article | 23 November 2015 Paper

Comparative study of the laser damage threshold and optical characteristics of Ta2O5-SiO2 multilayers deposited using various methods

Roelene Botha, Silvia Schwyn Thöny, Martin Grössl, Safer Mourad, Clau Maissen, Jacobus Venter, Thomas Südmeyer, Martin Hoffmann, Pavel Bulkin, Sabine Linz-Dittrich, David Bischof, Markus Michler, Stefan Rinner, Andreas Ettemeyer

Proceedings Volume 9632, 963203 (2015) https://doi.org/10.1117/12.2194084

KEYWORDS: Manufacturing, Optical coatings, Polishing, Laser induced damage, Laser damage threshold, Silica, Multilayers, Optics manufacturing, Ion beams, Sputter deposition

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Proceedings Article | 22 June 2015 Paper

Smart optical distance sensor for automatic welding detection

Michael Kahl, Stefan Rinner, Andreas Ettemeyer

Proceedings Volume 9525, 952526 (2015) https://doi.org/10.1117/12.2190736

KEYWORDS: Sensors, Light sources, Signal detection, Ultraviolet radiation, Optical filters, Lenses, Charge-coupled devices, Interference (communication), Distance measurement, Optical simulations

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Proceedings Article | 13 May 2013 Paper

Scanning fringe projection for fast 3D inspection

Marc Honegger, Michael Kahl, Sandra Trunz, Stefan Rinner, Andreas Ettemeyer, Patrick Lambelet

Proceedings Volume 8788, 878814 (2013) https://doi.org/10.1117/12.2020260

KEYWORDS: Cameras, Projection systems, Light emitting diodes, Image acquisition, 3D metrology, Inspection, Content addressable memory, Calibration, Imaging systems, Semiconducting wafers

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In an earlier paper we have described a concept for high speed 3D inspection using fringe projection techniques. We use a special CMOS camera with 300 x 300 px which can calculate the phase on board. The focus of the first step of development had been a fringe projector, which was able to modulate the projected fringes with up to 250 kHz. In the second step the image acquisition part of the system was developed. In case of 3D measurement with a matrix camera, the camera resp. the measuring object has to be moved stepwise in the lateral direction to cover multiple acquisition areas of the measurement object. Between each image the lateral movement has to correspond to the field of view of the camera. At the intended very high image acquisition rates the high acceleration of the system between each image will lead to inacceptable mechanical forces. In order to obtain a continuous scanning procedure and at the same time to use the performance of a matrix camera, a special lens system was developed. A measurement field 120 mm long and 3 mm wide is imaged onto the camera. The width of the measuring field is imaged onto the 300 rows of the camera, giving a lateral resolution of 10 μm. In the longitudinal direction the 120 mm object length is divided into 12’000 lines to reach the same resolution of 10 μm. Due to technical reasons that will be described later only 240 of the 300 pixel rows on the chip were used. Consequently, with each camera shot 240 separated lines are imaged onto the chip. Between each of these 240 lines there is a large empty space, which is not imaged by the camera. In principle, the camera is operating as 240 single line cameras. Therefore, if the camera is shifted in an inclined direction to the camera orientation over the object, the empty spaces can be recorded as well. In an optimum alignment, the complete measuring object can be scanned in a continuous movement, covering the total length of 120 mm. In this paper we will describe this image acquisition system and give first measuring results.

Proceedings Article | 27 May 2011 Paper

High speed fringe projection for fast 3D inspection

Sandra Caspar, Marc Honegger, Stefan Rinner, Patrick Lambelet, Carlo Bach, Andreas Ettemeyer

Proceedings Volume 8082, 80820Y (2011) https://doi.org/10.1117/12.888930

KEYWORDS: Cameras, Inspection, Light emitting diodes, Modulation, Phase shifts, Image acquisition, Fringe analysis, Projection systems, 3D metrology, Imaging systems

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