Dr. Stéphane Tisserand Profile

Dr. Stéphane Tisserand

CEO at SILIOS Technologies

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Publications (16)

Proceedings Article | 12 July 2023 Open Access

Pixelated multi-spectral filters assessment for space applications

M. Boutillier, K. Mathieu, S. Petit-Poupart, C. Virmontois, E. Cucchetti, A. Delahaye, V. Lalucaa, D. Veyrié, M. Hubert, V. Sauget, S. Tisserand

Proceedings Volume 12777, 127776R (2023) https://doi.org/10.1117/12.2691353

KEYWORDS: Tunable filters, Optical filters, Spectral response, Astronomical imaging, Quantum efficiency, Visual inspection, Matrices, Interpolation, Incident light, Crosstalk

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Proceedings Article | 27 May 2022 Presentation + Paper

Development and integration of new functions in InGaAs imaging

Thierry Colin, Gulnar Dagher, Cyrille Bonvalot, Romain Grille, Margaux Renaudat Saint-Jean, Jérome Fantini, Jérome Coussement, Nicolas Péré-Laperne, Stéphane Tisserand, Marc Hubert, Vincent Sauget, Kevin Bigot, Yves Courcol, Hervé Lonjaret

Proceedings Volume 12107, 1210707 (2022) https://doi.org/10.1117/12.2618921

KEYWORDS: Staring arrays, Short wave infrared radiation, Indium gallium arsenide, Optical filters, Quantum efficiency, Prototyping, Modulation transfer functions, Cameras, Image filtering, Infrared radiation

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Proceedings Article | 12 July 2019 Open Access

Optical performance of NISP grisms flight models for EUCLID mission

Anne Costille, A. Caillat, C. Rossin, S. Pascal, P. Sanchez, B. Foulon, C. Pariès, S. Tisserand, Y. Salaun, T. Weber

Proceedings Volume 11180, 1118013 (2019) https://doi.org/10.1117/12.2535958

KEYWORDS: Manufacturing, Fermium, Frequency modulation, Optical filters, Optics manufacturing, Prisms, Wavefronts, Performance modeling, Sensors, Error analysis

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The launch of ESA EUCLID mission is foreseen in 36020. The goal of the mission is to understand the nature of the dark energy and to map the geometry of the dark matter. The EUCLID telescope will be equipped with two instruments working in the visible range (VIS) and in the IR range (NISP) to investigate the distance-redshift relationship and the evolution of cosmic structures. The NISP (Near Infrared Spectro-Photometer) will operate in the near-IR spectral range (0.9-2μm) with two observing modes: the photometric mode for the acquisition of images with broadband filters, and the spectroscopic mode for the acquisition of slitless dispersed images on the detectors. NISP is then using four low resolution grisms to acquire spectroscopic image in different orientations to better distinguish the spectra observed and to cover two spectral ranges: 1250-1850nm range, and 920-1300nm range. Since 2010, Laboratoire d’Astrophysique de Marseille is working on the development and the test of the NISP grisms, that are complex optical components. The grism combines four main optical functions: a grism function done by the grating on the prism hypotenuse, a spectral filter done by a multilayer filter deposited on the first face of the prism, a focus function done by the curved filter face of the prism and a spectral wavefront correction done by the grating which grooves paths are nor parallel, neither straight. The NISP instrument is now entering in the integration phase of the proto flight model of the instrument. Therefore, the NISP grism flight models have been manufactured and delivered to the grism wheel assembly for integration by end of 2017. In this paper, we present the optical performance and characteristics of the four EUCLID NISP grisms flight models that have been developed and manufactured by four different industrial partners then integrated and tested by LAM. We focus on the performance obtained on the optical performance of the component; wavefront error of the components, the spectral transmission and groove profiles. The test results analysis show that the grisms flight models for NISP are well within specifications with an efficiency better than 70% on the spectral bandpass and a wavefront error on surfaces better than 30nm RMS. The results on the component show a good control of the manufacturing and integration process despite the difficulties at the beginning of the project to manufacture these components.

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Proceedings Article | 17 November 2017 Open Access

Bulk silica NIR blazed transmission gratings made by Silios technologies

Amandine Caillat, Sandrine Pascal, Stéphane Tisserand, Kjetil Dohlen, Robert Grange, Vincent Sauget, Sophie Gautier

Proceedings Volume 10563, 105630O (2017) https://doi.org/10.1117/12.2304211

KEYWORDS: Optics manufacturing, Wavefronts, Near infrared, Silica, Etching, Zemax, Astronomical imaging, Manufacturing, Optical lithography, Prisms

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Proceedings Article | 7 August 2014 Paper

Bulk silica transmission grating made by reactive ion etching for NIR space instruments

Amandine Caillat, Sandrine Pascal, Stéphane Tisserand, Kjetil Dohlen, Robert Grange, Vincent Sauget, Sophie Gautier

Proceedings Volume 9151, 91511F (2014) https://doi.org/10.1117/12.2055095

KEYWORDS: Optics manufacturing, Wavefronts, Manufacturing, Silica, Etching, Reactive ion etching, Zemax, Optical alignment, Optical lithography, Prisms

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Proceedings Article | 4 March 2013 Paper

Handheld probe for portable high frame photoacoustic/ultrasound imaging system

K. Daoudi, P. van den Berg, O. Rabot, A. Kohl, S. Tisserand, P. Brands, W. Steenbergen

Proceedings Volume 8581, 85812I (2013) https://doi.org/10.1117/12.2003655

KEYWORDS: Ultrasonography, Imaging systems, Photoacoustic spectroscopy, Semiconductor lasers, Tissue optics, Pulsed laser operation, Diodes, Tissues, Transducers, Prototyping

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Proceedings Article | 5 October 2011 Paper

Resonances determination in microstructured films embedded in multilayered stacks

Benjamin Vial, Mireille Commandré, Frédéric Zolla, André Nicolet, Stephane Tisserand

Proceedings Volume 8168, 816822 (2011) https://doi.org/10.1117/12.897347

KEYWORDS: Finite element methods, Diffraction gratings, Diffraction, Transmittance, Multilayers, Dielectrics, Silica, Dielectric polarization, Polarization, Americium

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Proceedings Article | 30 September 2011 Paper

Manufacturing, testing, and metrology of axi-symmetric circular phase masks for stellar coronagraphy

Mamadou N'Diaye, Kjetil Dohlen, Stéphane Tisserand, Sophie Gautier, Kacem El Hadi, Gabriel Moreaux, Rémi Soummer, Salvador Cuevas, Celia Sánchez-Pérez

Proceedings Volume 8169, 81690G (2011) https://doi.org/10.1117/12.897010

KEYWORDS: Coronagraphy, Prototyping, Manufacturing, Stars, Metrology, Profilometers, Image enhancement, Design for manufacturability, Etching, Telescopes

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Proceedings Article | 14 May 2008 Paper

Development of diffractive antireflection structures on ZnSe for high power CO2 laser applications

Fabien Reversat, Thierry Berthou, Stéphane Tisserand, Lionel Dupuy, Sophie Gautier, Peter Muys, Danae Delbeke, David Grojo, Mohammed Laraichi, Philippe Delaporte

Proceedings Volume 6992, 69920I (2008) https://doi.org/10.1117/12.782633

KEYWORDS: Etching, Absorption, Antireflective coatings, Plasma, Reactive ion etching, Photomasks, Carbon dioxide lasers, Zinc, Lithography, Thin films

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Proceedings Article | 25 June 2007 Paper

Current developments and applications using multi-beam laser interference lithography for nanoscale structuring of materials

S. Z. Su, Ainhara Rodríguez, Santiago Olaizola, C. S. Peng, C. Tan, Yury Verevkin, Thierry Berthoud, Stéphane Tisserand

Proceedings Volume 6593, 65930G (2007) https://doi.org/10.1117/12.723620

KEYWORDS: Beam splitters, Fabrication, Optical lithography, Lithography, Nanolithography, Laser ablation, Photoresist materials, Laser crystals, Thin films, Laser applications

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Proceedings Article | 12 June 2007 Paper

Formation of 4-beam laser interference patterns for nanolithography

Jin Zhang, Zuobin Wang, Yury Verevkin, Santiago Olaizola, Changsi Peng, Chunlei Tan, Ainara Rodriguez, Eric Daume, Thierry Berthou, Stéphane Tisserand, Ze Ji

Proceedings Volume 6593, 65930I (2007) https://doi.org/10.1117/12.723782

KEYWORDS: Lithography, Nanolithography, Laser applications, Electron beam lithography, Control systems, Beam splitters, Nanotechnology, Laser systems engineering, Scanning probe lithography, Optical lithography

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Proceedings Article | 23 January 2007 Paper

Laser damage on diffractive optics

Laurent Gallais, Guillaume Demesy, Mireille Commandré, Stéphane Tisserand, Sophie Gauthier, Fabien Reversat, Marc Hubert

Proceedings Volume 6403, 640304 (2007) https://doi.org/10.1117/12.695413

KEYWORDS: Mirrors, Laser induced damage, Coating, Etching, Microscopy, Raster graphics, High power lasers, Atomic force microscopy, Computer simulations, Computer programming

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Proceedings Article | 25 October 2004 Paper

MAPS: a turbulence simulator for MCAO

Johann Kolb, Enrico Marchetti, Stephane Tisserand, Francis Franza, Bernhard Delabre, Frederic Gonte, Roland Brast, Sophie Jacob, Fabien Reversat

Proceedings Volume 5490, (2004) https://doi.org/10.1117/12.551478

KEYWORDS: Picosecond phenomena, Turbulence, Stars, Atmospheric optics, Point spread functions, Visible radiation, Telescopes, Wavefronts, Optical fibers, Optical simulations

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Proceedings Article | 18 February 2004 Paper

Ion implanted integrated optics (I3O) technology for planar lightwave circuits (PLCs) fabrication

Emmanuel Drouard, Ludovic Escoubas, Francois Flory, Stephane Tisserand, Laurent Roux

Proceedings Volume 5249, (2004) https://doi.org/10.1117/12.512714

KEYWORDS: Refractive index, Waveguides, Titanium, Silica, Ions, Integrated optics, Photonic integrated circuits, Transmittance, Optical fibers, Silicon

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Proceedings Article | 7 September 1999 Paper

Enhancement of the diffraction efficiency of titanium implanted gratings by associating them with optical interference coatings

Francois Flory, Ludovic Escoubas, Stephane Tisserand, Eric Nicolas, Gerard Albrand, F. Lemarchand, Laurent Roux

Proceedings Volume 3738, (1999) https://doi.org/10.1117/12.360094

KEYWORDS: Diffraction gratings, Diffraction, Refractive index, Titanium, Silica, Multilayers, Mirrors, Optical coatings, Dielectrics, Dielectric mirrors

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Proceedings Article | 20 February 1998 Paper

Ion implantation in dielectric thin films for passive and active components

Francois Flory, Laurent Roux, Stephane Tisserand, Herve Rigneault, Stephanie Robert, G. Mathieu

Proceedings Volume 3175, (1998) https://doi.org/10.1117/12.300659

KEYWORDS: Ion implantation, Dielectrics, Thin films, Tantalum, Silica, Glasses, Refractive index, Waveguides, Erbium, Coating

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Showing 5 of 16 publications

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