Dr. Stephanie Lemke
at Helmholtz-Zentrum Berlin
SPIE Involvement:
Author
Publications (1)

Proceedings Article | 9 June 2023 Presentation
Proceedings Volume PC12581, PC1258109 (2023) https://doi.org/10.1117/12.2666473
KEYWORDS: Optical components, Metrology, X-rays, X-ray optics, X-ray diffraction, X-ray characterization, Reflectivity, Manufacturing, Mirrors, Free electron lasers

SIGN IN TO:
  • View contact details

UPDATE YOUR PROFILE
Is this your profile? Update it now.
Don’t have a profile and want one?

Advertisement
Advertisement
Back to Top