Stijn Beuckels
at KU Leuven
SPIE Involvement:
Author
Publications (1)

Proceedings Article | 20 May 2022 Poster + Presentation + Paper
Stijn Beuckels, Jan Audenaert, Frédéric Leloup, Peter Hanselaer
Proceedings Volume 12136, 1213610 (2022) https://doi.org/10.1117/12.2621134
KEYWORDS: CMOS sensors, Calibration, Image sensors, Reflection, Cameras, Human vision and color perception, Imaging metrology, Optical metrology, Metrology

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