It has been recently suggested that optical interferometers may not require a phase-stable optical link between the stations if instead sources of quantum-mechanically entangled pairs could be provided to them, enabling extra- long baselines and benefiting numerous topics in astrophysics and cosmology. We developed a new variation of this idea, proposing that two photons from different sources could be interfered at two decoupled stations, requiring only a slow classical information link between them. We show that this approach could allow high- precision measurements of the relative astrometry of the two sources, with a basic calculation giving angular precision of 10 µas in a few hours’ observation of two bright stars. We also give requirements on the instrument for these observations, in particular on its temporal and spectral resolution. Finally, we discuss possible technologies for the instrument implementation and first proof-of-principle experiments.
A novel non-contact optical profiler described in this paper is designed and made for measuring the surface characteristics of optical parts. Measurements are based on a combination of an optical heterodyne technique and a precise phase measurement procedure without the need of a reference surface. A Zeeman-split He-Ne laser is employed as the light source which offers two common-path polarized beams. The frequency difference between the beams is 1.8 MHz. A special optical head is designed and fashioned as a beam splitter which contains a birefringent lens and an objective. The whole optical system is completely common- path. This allows the optical common-mode rejection technique to be applied in the system for minimizing the environmental effects in measurements such as air turbulence, vibrations and temperature variations. To keep the sample surface focused on the ordinary rays in the optical head, an astigmatic autofocus system is employed. A stepping micro-stepping system can move the optical head in the range of 25 mm with 0.1 micrometers resolution. A data acquisition system is made to control the auto-focus system, data receiving and analyses. This makes the measurement automatically while the sample is being scanned. The characteristics of the surface can be displayed on the computer screen. The theoretical and experimental analyses of the profiler are completed. The profiler measures samples with 1.1 angstroms height accuracy and 4 micrometers lateral resolution when a 40X objective is used in the optical head. The accuracy comparisons of the profiler with different objectives 5X, 10X, 20X, and 40X are shown in good agreement. The advantages of the present profiler are presented. Based on the autofocus system, the profiler optical system will be designed to mount on a large linear air-bearing slide, so that it is capable of scanning over a distance covering from 4 micrometers to 1 m.
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