Prof. Thurmon E. Lockhart
at Virginia Polytechnic Institute and State Univ
SPIE Involvement:
Author
Publications (1)

Proceedings Article | 20 June 2014 Paper
Proceedings Volume 9091, 90911J (2014) https://doi.org/10.1117/12.2050995
KEYWORDS: Sensors, Algorithm development, Injuries, Gait analysis, Statistical analysis, Error analysis, Data centers, Neodymium, Nonlinear optics, Tolerancing

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