The surface profile of Wolter type-I mirror has a great impact on the performance of Solar X-ray Telescope. According to the existing fabrication instrument and experimental conditions in our lab, an
in situ Long Trace Profiler is developed and set up on the fabrication instrument in order to measure the surface profile of Wolter mirror in real time during fabrication process. Its working mechanism, structural parameters and data processing algorithm are investigated. The prototype calibrated by a standard plane mirror is used to measure a sample of Wolter type-I mirror. The results show that our prototype can achieve an accuracy of 2.6μrad rms for slope error with a stability of 1.33μrad during the whole measurement period. This can meet further fabrication requirements.
The Extreme Ultraviolet Telescope (EUT) is composed of a set of four individual normal incidence multilayer-coated
telescopes that obtained selected spectrum bandpass (131 A-304 A) of the solar atmosphere. Before the launch, it is
necessary to calibrate the imaging performance of EUT. We build a test system for EUT by two ways. Resolution test
was performed using 1951 Standard Air Force High Resolution Test target, and the optical resolution limits down to
0.96arc-second at 404.7nm. A pinhole as a target placed on the focal point of a collimator is illuminated mercury lump.
The intensity distribution is obtained by knife-edge scanning with low noise photon-counting detector. The slope of the
knife-edge scan is equal to the value of the line spread function (LSF). Based on these measurement, we calculate the e
modulation transfer function, which is highly closed to the simulation result of zemax. The experiment result indicates
that the test system works well. For further work, the working wavelength test will be done with the help of those
experiment results.
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