Dr. Tomas Lindstrom Profile

Dr. Tomas Lindstrom

at Amic AB

SPIE Involvement:

Author

Publications (5)

Proceedings Article | 17 January 2003 Paper

Novel type of micromachined retroreflector

Axel Lundvall, Tomas Lindstroem, Fredrik Nikolajeff

Proceedings Volume 4984, (2003) https://doi.org/10.1117/12.477834

KEYWORDS: Retroreflectors, Mirrors, Spherical lenses, Polymers, Reflectors, Monochromatic aberrations, Reflection, Photoresist materials, Silicon, Optics manufacturing

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SPIE Journal Paper | 1 February 2000

Total integrated scattering from transparent substrates in the infrared region: validity of scalar theory

Tomas Lindstroem, Daniel Roennow

OE, Vol. 39, Issue 02, (February 2000) https://doi.org/10.1117/12.10.1117/1.602386

KEYWORDS: Scattering, Light scattering, Reflectivity, Transmittance, Interfaces, Profilometers, Integrating spheres, Scatter measurement, Reflection, Surface roughness

Proceedings Article | 5 October 1999 Paper

Candidate materials for semitransmitting DVD mirror coatings

Tomas Lindstrom, Roger Loow, Carl-Gustaf Ribbing

Proceedings Volume 3779, (1999) https://doi.org/10.1117/12.368215

KEYWORDS: Reflectivity, Digital video discs, Copper, Mirrors, Silver, Reflection, Semiconductors, Transmittance, Refractive index, Thin films

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Proceedings Article | 6 September 1999 Paper

International round-robin experiment on optical total scattering at 633 nm according to ISO/DIS 13696

Puja Kadkhoda, Claude Amra, Jean Bennett, Carole Deumie, Angela Duparre, Stefan Gliech, Christian Jolie, Helmut Kessler, Hans Lauth, Tomas Lindstroem, A. Mueller, Norbert Reng, Carl-Gustaf Ribbing, Detlev Ristau, Rainer Schuhmann, Uwe Schuhmann, Markus Tilsch

Proceedings Volume 3739, (1999) https://doi.org/10.1117/12.360187

KEYWORDS: Scattering, Laser scattering, Scatter measurement, Optical spheres, Standards development, Optical components, Laser systems engineering, Laser applications, Inspection, Laser development

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Proceedings Article | 26 September 1997 Paper

Surface roughness in sputtered tin oxide films studied by light scattering and atomic force microscopy

Tomas Lindstroem, Jan Isidorsson, Gunnar Niklasson

Proceedings Volume 3141, (1997) https://doi.org/10.1117/12.287804

KEYWORDS: Interfaces, Tin, Atomic force microscopy, Oxides, Light scattering, Reflectivity, Surface roughness, Thin films, Diffuse reflectance spectroscopy, Transmittance

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