Dr. Venkatraman Iyer
Senior Director at KLA Corp
SPIE Involvement:
Author
Publications (2)

Proceedings Article | 17 October 2008 Paper
Proceedings Volume 7122, 71223G (2008) https://doi.org/10.1117/12.801831
KEYWORDS: Inspection, Reticles, Line edge roughness, Signal to noise ratio, Sensors, Detection and tracking algorithms, Spatial frequencies, Modulation transfer functions, Image processing, Defect detection

Proceedings Article | 9 July 1998 Paper
Proceedings Volume 3355, (1998) https://doi.org/10.1117/12.316776
KEYWORDS: Charge-coupled devices, Quantum efficiency, Metals, Hydrogen, Coating, Silicon, Platinum, Back illuminated sensors, Oxides, Astronomy

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