Dr. Vincent Lee
at Block Engineering LLC
SPIE Involvement:
Author
Publications (2)

SPIE Journal Paper | 18 May 2020 Open Access
OE, Vol. 59, Issue 09, 092003, (May 2020) https://doi.org/10.1117/12.10.1117/1.OE.59.9.092003
KEYWORDS: Reflectivity, Hyperspectral imaging, Standoff detection, Long wavelength infrared, Imaging systems, Reflection, Contamination, Cameras, Absorption, Silicon

Proceedings Article | 27 April 2020 Presentation
Anish Goyal, Derek Wood, Joshua Rollag, Vincent Lee, Peter Schwarz, Leyun Zhu
Proceedings Volume 11416, 1141608 (2020) https://doi.org/10.1117/12.2559642
KEYWORDS: Standoff detection, Long wavelength infrared, Hyperspectral imaging, Imaging systems, Laser systems engineering, Chemical detection, Prototyping, Chemical analysis, Laser development, Infrared imaging

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