In the field of micro- and nanotechnology, the white light neutron Microchannel Plate (MCP) is a key component. It utilizes materials internally doped with nuclear-sensitive elements to capture neutrons and release converted electrons, triggering the electron multiplier process. In order to achieve high temporal resolution, high spatial resolution, and efficient detection of neutrons across a wider energy spectrum, the high uniformity of the microchannel plate is crucial. The corrosion step is crucial in the microchannel plate preparation process as it directly affects the formation and uniformity of the channels. To ensure consistent imaging quality, the corrosion level in each channel must be uniform. This paper focuses on the effect of various alkaline corrosion processes on the uniformity of microchannel plates doped with the neutron conversion material 10B . The results show that increasing the strength of alkaline treatments leads to poorer microchannel plate uniformity. This is because alkali metal oxides tend to reduce more alkali metal monomers during hydrogen reduction at high temperatures. This leads to an uneven distribution of alkali metals within each channel on the MCP surface, resulting in inconsistent gain and poorer uniformity. However, the uniformity of the microchannel plate can be effectively improved by controlling the concentration and duration of alkaline corrosion. Therefore, precise control of the alkaline corrosion process, especially the concentration and duration of alkaline corrosion, is expected to significantly enhance the performance of the microchannel plate and advance the development of white light neutron source resonance imaging technology.
This paper proposed a "high-speed imaging + digital processing" evaluation method to solve the problem of scintillation noise of low light image intensifiers under low illumination, which fills the gap in the quantitative evaluation of scintillation noise characteristics under low illumination in China. It was found that the scintillation noise is mainly characterized by scintillations with a diameter over 50μm and a duration of sub-microsecond or less. The frequency and the brightness of the scintillations are used to quantitatively evaluate scintillation noise. The effects of the input illuminance and luminous gain on the scintillation noise of the domestic low light image intensifier were investigated by the proposed method. With the increase of input illuminance, the frequency of scintillation noise increases linearly, and the brightness does not change obviously. As the luminous gain of the image intensifier increases, the frequency of scintillation noise increases linearly, but the rate of increase in scintillation frequency is higher than that of luminous gain increase. Based on the characteristics of scintillation noise, such as size, duration, intensity, and the variation law with various conditions, the scintillation noise of the image intensifier can be further studied. The quantitative evaluation method of scintillation noise based on scintillation noise frequency and average equivalent input electron quantity proposed in this paper is of great significance to the breakthrough of scintillation noise and the improvement of the performance of image tubes under low illumination in the future.
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