Zoom CAM curve is an important part of the optical system imaging. The processing accuracy of the curve directly affects the image clarity and consistency of the optical system. In this paper, a high precision measuring device for zoom CAM curve is designed, and an optimization method of testing results is adopted. According to the curve of the CAM rotation Angle and the number of teeth on the surface of the cylindrical, with mesh number as the sample size, relative to the CAM follower parts through the grating ruler curve of linear displacement measurement and corresponding data fitting. The regression analysis method is adopted to analyze the measurement results of the grating ruler based on the detection of the altimeter, and the regression equation is obtained and modified to optimize the measurement fitting data, so as to finally improve the detection accuracy of the zoom CAM curve. The confidence interval of machining accuracy based on grating ruler CAM curve is analyzed and evaluated by an example. The results show that the zoom CAM curve detection device and result optimization method proposed in this paper have the characteristics of high accuracy, high stability and easy realization.
As the observation demand increased, the demand of the lens imaging quality rising. Segment- Compound baffle design method was proposed in this paper. Three traditional methods of baffle design they are characterized as Inside to Outside, Outside to Inside, and Mirror Symmetry. Through a transmission type of optical system, the four methods were used to design stray light suppression structure for it, respectively. Then, structures modeling simulation with Solidworks, CAXA, Tracepro, At last, point source transmittance (PST) curve lines were got to describe their performance. The result shows that the Segment- Compound method can inhibit stay light more effectively. Moreover, it is easy to active and without use special material.
Access to the requested content is limited to institutions that have purchased or subscribe to SPIE eBooks.
You are receiving this notice because your organization may not have SPIE eBooks access.*
*Shibboleth/Open Athens users─please
sign in
to access your institution's subscriptions.
To obtain this item, you may purchase the complete book in print or electronic format on
SPIE.org.
INSTITUTIONAL Select your institution to access the SPIE Digital Library.
PERSONAL Sign in with your SPIE account to access your personal subscriptions or to use specific features such as save to my library, sign up for alerts, save searches, etc.