Yaron Nechemya
at SCD SemiConductor Devices
SPIE Involvement:
Author
Publications (1)

Proceedings Article | 13 June 2023 Presentation + Paper
L. Shkedy, I. Hirsh, P. Klipstein, M. Nitzani, S. Gliksman, N. Ben Ari, N. Shiloah, C. Jakobson, Y. Lury, H. Nahor, O. Klin, N. Yaron, O. Magen, Y. Benny, A. Cahana, N. Ashush, Y. Hagbi, O. Dicker, B. Milgrom, T. Markovitz
Proceedings Volume 12534, 1253414 (2023) https://doi.org/10.1117/12.2663727
KEYWORDS: Readout integrated circuits, Mid-IR, Imaging systems, Signal detection, Nonuniformity corrections, Integrated optics, Staring arrays, Modulation transfer functions, Signal to noise ratio

SIGN IN TO:
  • View contact details

UPDATE YOUR PROFILE
Is this your profile? Update it now.
Don’t have a profile and want one?

Advertisement
Advertisement
Back to Top