Yaseer A. Durrani
at Univ Politécnica de Madrid
SPIE Involvement:
Author
Publications (1)

Proceedings Article | 10 May 2007 Paper
Proceedings Volume 6590, 659002 (2007) https://doi.org/10.1117/12.721182
KEYWORDS: Monte Carlo methods, Tin, Statistical analysis, Error analysis, Switching, Genetic algorithms, Intellectual property, Telecommunications, Electronic design automation, Device simulation

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