Young-Hwa Noh
at SAMSUG Electronics Co Ltd
SPIE Involvement:
Author
Publications (3)

Proceedings Article | 9 September 2013 Paper
Proceedings Volume 8880, 888016 (2013) https://doi.org/10.1117/12.2025569
KEYWORDS: Photomasks, Manufacturing, Control systems, Process control, Semiconductors, Semiconducting wafers, Telecommunications, Wafer manufacturing, Mask making, Extreme ultraviolet

Proceedings Article | 20 October 2006 Paper
Proceedings Volume 6349, 634928 (2006) https://doi.org/10.1117/12.686534
KEYWORDS: Photomasks, Critical dimension metrology, Semiconducting wafers, Tolerancing, Photoresist processing, Optical proximity correction, Mask making, Semiconductors, Manufacturing, Computer simulations

Proceedings Article | 20 May 2006 Paper
Proceedings Volume 6283, 62832N (2006) https://doi.org/10.1117/12.681800
KEYWORDS: Data conversion, Computed tomography, Photomasks, Double patterning technology, Lithography, Resolution enhancement technologies, Semiconductors, Electronics, Data centers, Critical dimension metrology

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