Dr. Youngkyu Park
at SAMSUNG Electronics Co Ltd
SPIE Involvement:
Author
Publications (2)

Proceedings Article | 27 April 2023 Paper
Proceedings Volume 12496, 124962X (2023) https://doi.org/10.1117/12.2658131
KEYWORDS: Critical dimension metrology, Semiconducting wafers, Metrology, Semiconductors, Mueller matrices, Ellipsometry, Inspection

Proceedings Article | 27 April 2023 Presentation + Paper
Proceedings Volume 12496, 124960L (2023) https://doi.org/10.1117/12.2657414
KEYWORDS: Overlay metrology, Mueller matrices, Semiconducting wafers, Spectroscopic ellipsometry, Critical dimension metrology, Imaging spectroscopy, Metrology, Polarization, Polysomnography, Image sensors

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