Yu-Hao Li
at National Taiwan Univ
SPIE Involvement:
Author
Publications (1)

Proceedings Article | 4 March 2022 Presentation + Paper
Proceedings Volume 11990, 1199008 (2022) https://doi.org/10.1117/12.2608433
KEYWORDS: Annealing, Thermal effects, Silicon, Mid-IR, Chromium, Signal to noise ratio, Sensors, Photodetectors, Silicon films, Thin films

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