Mr. Yves A. Gilliand Profile

Yves A. Gilliand

Manager Sales / Key Accounts at MIKROP AG

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Publications (2)

Proceedings Article | 28 November 2007 Paper

New low-cost metrology system for mass production

Thomas Blümel, Markus Bosse, Jan Fehse, Yves Gilliand, Ricarda Kafka, Ralph Neubert, Christian Zellweger

Proceedings Volume 6834, 68340O (2007) https://doi.org/10.1117/12.755136

KEYWORDS: Wavefronts, Sensors, Cameras, Optics manufacturing, Metrology, Inspection, Spherical lenses, Photovoltaics, Error analysis, Wavefront sensors

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SPIE Journal Paper | 1 August 1999

300-mm-aperture phase-shifting Fizeau interferometer

Philip Fairman, B. Ward, Bozenko Oreb, David Farrant, Yves Gilliand, Christopher Freund, Achim Leistner, Jeffrey Seckold, Christopher Walsh

OE, Vol. 38, Issue 08, (August 1999) https://doi.org/10.1117/12.10.1117/1.602180

KEYWORDS: Phase shifts, Nanoimprint lithography, Optical testing, Monochromatic aberrations, Wavefronts, Fizeau interferometers, Semiconductor lasers, Sensors, Beam splitters, Foam

Conference Committee Involvement (1)

Optical Design and Testing III

12 November 2007 | Beijing, China

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