Dr. Yves C. Martin Profile

Dr. Yves C. Martin

Research Staff Member at IBM Thomas J Watson Research Ctr

SPIE Involvement:

Author | Editor

Publications (6)

Proceedings Article | 17 May 2019 Presentation + Paper

Monolithically integrated silicon photonic chip sensor for near-infrared trace-gas spectroscopy

Eric Zhang, Yves Martin, Jason Orcutt, Chi Xiong, Martin Glodde, Nathan Marchack, Elizabeth Duch, Tymon Barwicz, Laurent Schares, William M. Green

Proceedings Volume 11010, 110100B (2019) https://doi.org/10.1117/12.2519206

KEYWORDS: Sensors, Waveguides, Photonic integrated circuits, Spectroscopy, Silicon, Semiconductor lasers, Silicon photonics, Integrated photonics, Sensor networks, Fabry–Perot interferometers

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Proceedings Article | 4 March 2019 Paper

Silicon photonic integrated circuit for on-chip spectroscopic gas sensing

Chi Xiong, Yves Martin, Eric Zhang, Jason Orcutt, Martin Glodde, Laurent Schares, Tymon Barwicz, Chu Teng, Gerard Wysocki, William M. Green

Proceedings Volume 10923, 109230G (2019) https://doi.org/10.1117/12.2511793

KEYWORDS: Waveguides, Sensors, Methane, Silicon photonics, Silicon, Spectroscopy, Absorption, Photodetectors, Tunable lasers

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Proceedings Article | 16 May 2018 Presentation + Paper

Localization and quantification of trace-gas fugitive emissions using a portable optical spectrometer

Eric Zhang, Chu Teng, Theodore van Kessel, Levente Klein, Ramachandran Muralidhar, Chi Xiong, Yves Martin, Jason Orcutt, Marwan Khater, Laurent Schares, Tymon Barwicz, Nathan Marchack, Swetha Kamlapurkar, Sebastian Engelmann, Gerard Wysocki, Norma Sosa, William M. Green

Proceedings Volume 10629, 106290Y (2018) https://doi.org/10.1117/12.2305174

KEYWORDS: Sensors, Spectroscopy, Methane, Optical sensors, Photodetectors, Absorption spectroscopy, Absorption, Calibration, Absorbance

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Proceedings Article | 23 February 2018 Presentation + Paper

Breaking the mold of photonic packaging

Tymon Barwicz, Ted Lichoulas, Yoichi Taira, Yves Martin, Shotaro Takenobu, Alexander Janta-Polczynski, Hidetoshi Numata, Eddie Kimbrell, Jae-Woong Nah, Bo Peng, Darrell Childers, Robert Leidy, Marwan Khater, Swetha Kamlapurkar, Elaine Cyr, Sebastian Engelmann, Paul Fortier, Nicolas Boyer

Proceedings Volume 10535, 105350R (2018) https://doi.org/10.1117/12.2290230

KEYWORDS: Packaging, Silicon photonics, Polymers, Waveguides, Interfaces, Optical alignment

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Proceedings Article | 22 August 2001 Paper

Automated search method for AFM and profilers

Michael Ray, Yves Martin

Proceedings Volume 4344, (2001) https://doi.org/10.1117/12.436729

KEYWORDS: Semiconducting wafers, Atomic force microscopy, Manufacturing, Profilometers, Metrology, Detection and tracking algorithms, Signal processing, Process control, Mathematical modeling, Atomic force microscope

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Showing 5 of 6 publications

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