Zengyang Gao
at Fraunhofer-Institut für Angewandte Optik und Feinmechanik IOF
SPIE Involvement:
Author
Publications (1)

Proceedings Article | 12 June 2023 Presentation + Paper
Proceedings Volume 12536, 125360P (2023) https://doi.org/10.1117/12.2663331
KEYWORDS: 3D metrology, Cameras, Long wavelength infrared, Mid-IR, Sensors, Time metrology, Gas lasers, 3D projection, 3D image processing, Spinel

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