The laser beam quality measurement has become a hot topic in the field of laser engineering nowadays. Based on the
method of Hartmann-Shack, the four-wave lateral shearing interferometer is presented in this paper to achieve the laser
beam shape parameters. The principle of shearing technology is described in detail. Parameters of semiconductor laser at
532nm and ZYGO interferometer laser are tested based on the method of four-wave lateral shearing interference and their
test results are compared with the nominal parameters. As the results, the test results are basically consistent with the
nominal value, which fully shows the feasibility of the four-wave lateral shearing interference method.
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