Zhenzhong Wang
SPIE Involvement:
Author
Publications (1)

Proceedings Article | 24 August 2009 Paper
Zhen-Zhong Wang, Qing-An Huang, Jie-Ying Tang
Proceedings Volume 7381, 73812S (2009) https://doi.org/10.1117/12.835690
KEYWORDS: Reliability, Failure analysis, Microelectromechanical systems, Capillaries, Microopto electromechanical systems, Instrument modeling, Interfaces, Humidity, Optical testing, Bridges

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