Riaz R. Haque
Product Evaluation Engineer
SPIE Involvement:
Author
Publications (2)

Proceedings Article | 18 March 2016 Paper
Proceedings Volume 9776, 97760F (2016) https://doi.org/10.1117/12.2219708
KEYWORDS: Photomasks, Extreme ultraviolet lithography, Extreme ultraviolet, 3D modeling, Phase shifts, Systems modeling, Deep ultraviolet, Monochromatic aberrations, Diffraction, Lithography, 3D image processing, Point spread functions

Proceedings Article | 7 March 2014 Paper
Proceedings Volume 8980, 898012 (2014) https://doi.org/10.1117/12.2037921
KEYWORDS: Modulators, Reflectivity, Modulation, Dielectrics, Interfaces, Plasmonics, Metamaterials, Oxides, Multilayers, Electrooptic modulators

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