Wan Xu
at Oakland University
SPIE Involvement:
Author
Publications (1)

Proceedings Article | 26 January 2016 Paper
Wan Xu, Xiu Feng, Junrui Li, Xinfeng Shi, Tian Bai
Proceedings Volume 9903, 990310 (2016) https://doi.org/10.1117/12.2211507
KEYWORDS: Digital image correlation, Safety, CCD cameras, Calibration, Cameras, Strain analysis, Image processing, Speckle, Mechanical engineering, In situ metrology

SIGN IN TO:
  • View contact details

UPDATE YOUR PROFILE
Is this your profile? Update it now.
Don’t have a profile and want one?

Advertisement
Advertisement
Back to Top