Zhiwei Liu
at National Institute of Metrology, China
SPIE Involvement:
Author
Publications (2)

Proceedings Article | 20 November 2024 Poster + Paper
Proceedings Volume 13241, 132411N (2024) https://doi.org/10.1117/12.3036001
KEYWORDS: Calibration, Sensors, Radiometry, Cryogenics, Sensor calibration, Radiometric calibration, Optical testing, Measurement uncertainty, Beam splitters, Solar radiation

Proceedings Article | 9 October 2021 Poster + Paper
Proceedings Volume 11899, 118990Z (2021) https://doi.org/10.1117/12.2601281
KEYWORDS: Measurement devices, Optical testing, Metrology

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