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4 April 2022 A unified artifact correction framework for C-arm photon counting cone beam CT
Mang Feng, Xu Ji, Kevin Treb, Chengzhu Zhang, Emily Cai, Ran Zhang, Sarvesh Periyasamy, Paul Laeseke, Ke Li
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Proceedings Volume PC12031, Medical Imaging 2022: Physics of Medical Imaging; PC120310K (2022) https://doi.org/10.1117/12.2612711
Event: SPIE Medical Imaging, 2022, San Diego, California, United States
Abstract
In this work, a unified framework was developed to jointly address scatter artifacts, detector nonuniformity-induced concentric artifacts, and beam hardening artifacts in C-arm photon counting detector (PCD) cone beam CT. By leveraging the energy-resolving capability of PCDs, a better estimation of the scattered photon signal was obtained via a photoelectric-Compton scattering decomposition. Next, detector nonuniformity and beam hardening artifacts were jointly corrected via a second-round projection domain pixel-wise material decomposition. Both phantom and in vivo animal results demonstrated that the proposed correction method generated high-quality and quantitative PCD cone beam CT images for image-guided interventions.
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Mang Feng, Xu Ji, Kevin Treb, Chengzhu Zhang, Emily Cai, Ran Zhang, Sarvesh Periyasamy, Paul Laeseke, and Ke Li "A unified artifact correction framework for C-arm photon counting cone beam CT", Proc. SPIE PC12031, Medical Imaging 2022: Physics of Medical Imaging, PC120310K (4 April 2022); https://doi.org/10.1117/12.2612711
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KEYWORDS
Sensors
Photon counting
Signal detection
Prototyping
Scattering
Semiconductors
X-ray computed tomography
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