CONFERENCE PROCEEDINGS
Advanced Search
Home > Proceedings > Volume 0289 > Article
Paper
29 October 1981 Beam Condenser-Microscope System For High Pressure Studies And General Microsampling
J. W. Brasch, C. J. Riggle
Author Affiliations +
Proceedings Volume 0289, 1981 Intl Conf on Fourier Transform Infrared Spectroscopy; (1981) https://doi.org/10.1117/12.932124
Event: 1981 International Conference on Fourier Transform Infrared Spectroscopy, 1981, Columbia, United States
Abstract
The development of a new, versatile beam condenser system for FT-IR spectrometers will be described. Primarily designed for use with the diamond-anvil high pressure cell, it also serves as a very convenient accessory for general microsampling. A major advantage of the system is the routine capability to visually observe the sample, using conventional optical microscopy, while the sample remains in place in the spectrometer. This adds a powerful tool to spectral studies of phase transitions, decompositions, kinetics, and distributions in microscopically heterogeneous samples. Applications of the system in high pressure studies of model lubricants will be discussed.
© (1981) COPYRIGHT Society of Photo-Optical Instrumentation Engineers (SPIE). Downloading of the abstract is permitted for personal use only.
Citation Download Citation
J. W. Brasch and C. J. Riggle "Beam Condenser-Microscope System For High Pressure Studies And General Microsampling", Proc. SPIE 0289, 1981 Intl Conf on Fourier Transform Infrared Spectroscopy, (29 October 1981); https://doi.org/10.1117/12.932124
ACCESS THE FULL ARTICLE
ORGANIZATIONAL
Sign in with credentials provided by your organization.
INSTITUTIONAL
Select your institution to access the SPIE Digital Library.
SELECT YOUR INSTITUTION
PERSONAL
Sign in with your SPIE account to access your personal subscriptions or to use specific features such as save to my library, sign up for alerts, save searches, etc.
PERSONAL SIGN IN
No SPIE Account? Create one
PURCHASE THIS CONTENT
SUBSCRIBE TO DIGITAL LIBRARY
50 downloads per 1-year subscription
Members: $195
Non-members: $335 ADD TO CART
25 downloads per 1 - year subscription
Members: $145
Non-members: $250 ADD TO CART
PURCHASE SINGLE ARTICLE
Includes PDF, HTML & Video, when available
Members: $17.00
Non-members: $21.00 ADD TO CART
PROCEEDINGS
 1 PAGES
DOWNLOAD PAPER SAVE TO MY LIBRARY
GET CITATION
Advertisement
Advertisement
RIGHTS & PERMISSIONS
Get copyright permission  Get copyright permission on Copyright Marketplace
KEYWORDS
Spectrometers
FT-IR spectroscopy
Optical microscopy
Visualization
Diamond
Fourier transforms
Statistical modeling
RELATED CONTENT
Subscribe to Digital Library
Receive Erratum Email Alert
Back to Top