High Precision Scanning Interferometer For Assessment Of Infrared Systems

D. R.J. Campbell

doi:10.1117/12.934259

27 May 1982 High Precision Scanning Interferometer For Assessment Of Infrared Systems

D. R.J. Campbell

Proceedings Volume 0330, Optical Systems Engineering II; (1982) https://doi.org/10.1117/12.934259
Event: 1982 Los Angeles Technical Symposium, 1982, Los Angeles, United States

Abstract

Pilkington P. E. were asked to develop a 300 mm. aperture, high-precision scanning interferometer with associated software for the semi-automatic testing of far infrared lenses and systems. The instrument as developed is capable of analysing and evaluating systems in terms of OTF, PSF, wavefront aberration, ray intersection patterns, polynomial fitting, aberration contouring, refractive index variation mapping and of providing a large range of representations of data. The speed of the analysis is commensurate with established techniques with an improvement in the accuracy and flexibility of use of the instrument over alternative measuring systems. Results from the developed system will be presented to show the effectiveness of the instrument.

Citation Download Citation

D. R.J. Campbell "High Precision Scanning Interferometer For Assessment Of Infrared Systems", Proc. SPIE 0330, Optical Systems Engineering II, (27 May 1982); https://doi.org/10.1117/12.934259

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