Paper
22 August 1988 A Wide Dynamic Range Tapped Linear Array Image Sensor
William D. Washkurak, Savvas G. Chamberlain, N.Daryl Prince
Author Affiliations +
Abstract
Detectors for acousto-optic signal processing applications require fast transient response as well as wide dynamic range. There are two major choices of detectors: conductive or integration mode. Conductive mode detectors have an initial transient period before they reach then' i equilibrium state. The duration of 1 his period is dependent on light level as well as detector capacitance. At low light levels a conductive mode detector is very slow; response time is typically on the order of milliseconds. Generally. to obtain fast transient response an integrating mode detector is preferred. With integrating mode detectors. the dynamic range is determined by the charge storage capability of the tran-sport shift registers and the noise level of the image sensor. The conventional net hod used to improve dynamic range is to increase the shift register charge storage capability. To achieve a dynamic range of fifty thousand assuming two hundred noise equivalent electrons, a charge storage capability of ten million electrons would be required. In order to accommodate this amount of charge. unrealistic shift registers widths would be required. Therefore, with an integrating mode detector it is difficult to achieve a dynamic range of over four orders of magnitude of input light intensity. Another alternative is to solve the problem at the photodetector aml not the shift, register. DALSA's wide dynamic range detector utilizes an optimized, ion implant doped, profiled MOSFET photodetector specifically designed for wide dynamic range. When this new detector operates at high speed and at low light levels the photons are collected and stored in an integrating fashion. However. at bright light levels where transient periods are short, the detector switches into a conductive mode. The light intensity is logarithmically compressed into small charge packets, easily carried by the CCD shift register. As a result of the logarithmic conversion, dynamic ranges of over six orders of magnitide are obtained. To achieve the short integration times necessary in acousto-optic applications. t he wide dynamic range detector has been implemented into a tapped array architecture with eight outputs and 256 photoelements. Operation of each 01)1,1)111 at 16 MHz yields detector integration times of 2 micro-seconds. Buried channel two phase CCD shift register technology is utilized to minimize image sensor noise improve video output rates and increase ease of operation.
© (1988) COPYRIGHT Society of Photo-Optical Instrumentation Engineers (SPIE). Downloading of the abstract is permitted for personal use only.
William D. Washkurak, Savvas G. Chamberlain, and N.Daryl Prince "A Wide Dynamic Range Tapped Linear Array Image Sensor", Proc. SPIE 0936, Advances in Optical Information Processing III, (22 August 1988); https://doi.org/10.1117/12.946915
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CITATIONS
Cited by 6 scholarly publications and 1 patent.
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KEYWORDS
Sensors

Electrons

Charge-coupled devices

Photodetectors

Diffusion

Capacitance

Image sensors

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