Presentation + Paper
5 May 2017 RMs1: qualification results of the rotary miniature Stirling cryocooler at Thales Cryogenics
Jean-Yves Martin, Cédric Seguineau, Sébastien Van-Acker, Mikel Sacau, Julien Le Bordays, Thierry Etchanchu, Christophe Vasse, Christian Abadie, Gilles Laplagne, Tonny Benschop
Author Affiliations +
Abstract
The trend for miniaturized Integrated Dewar and Cooler Assemblies (IDCA) has been confirmed over the past few years with several mentions of a new generation of IR detector working at High Operating Temperature (HOT). This key technology enables the use of cryocooler with reduced needs of cryogenics power. As a consequence, miniaturized IDCA are the combination of a HOT IR detector coupled with a low-size, low-weight and low-power (SWaP) cryocooler. Thales Cryogenics has developed his own line of SWaP products. Qualification results on linear solution where shown last year. The current paper focuses on the latest results obtained on RMs1 prototypes, the new rotary SWaP cryocooler from Thales Cryogenics. Cryogenic performances and induced vibrations are presented. In a second part, progress is discussed on compactness and weight on one side, and on power consumption on the other side. It shows how the trade-off made between weight and power consumption could lead to an optimized solution at system level. At least, an update is made on the qualification status.
Conference Presentation
© (2017) COPYRIGHT Society of Photo-Optical Instrumentation Engineers (SPIE). Downloading of the abstract is permitted for personal use only.
Jean-Yves Martin, Cédric Seguineau, Sébastien Van-Acker, Mikel Sacau, Julien Le Bordays, Thierry Etchanchu, Christophe Vasse, Christian Abadie, Gilles Laplagne, and Tonny Benschop "RMs1: qualification results of the rotary miniature Stirling cryocooler at Thales Cryogenics", Proc. SPIE 10180, Tri-Technology Device Refrigeration (TTDR) II, 1018008 (5 May 2017); https://doi.org/10.1117/12.2262603
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KEYWORDS
Cryocoolers

Cryogenics

Sensors

Infrared detectors

Manufacturing

Reliability

Temperature metrology

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