Paper
14 May 2007 Balancing measurement time and uncertainty when stitching in production environments
Author Affiliations +
Abstract
Long measurement times can be a bottleneck in an optics production environment. Ideally the measurement time will be quicker than polishing times. Large aperture and high precision parts, however, tend toward slower measurement times. Additionally, such parts usually need dedicated and expensive test setups. In 2004, QED Technologies introduced the Subaperture Stitching Interferometer (SSI®) to automatically stitch spherical surfaces (including hemispheres) up to 280 mm. The system also reduces measurement uncertainty with in-line calibration of systematic errors. With stitching, measurement time is a variable that can impact measurement uncertainty. The user can control such parameters as lattice design, systematic error calibration, and acquisition speed to optimally balance measurement speed and quality. We empirically demonstrate the trade-offs between measurement uncertainty and cycle time on the SSI.
© (2007) COPYRIGHT Society of Photo-Optical Instrumentation Engineers (SPIE). Downloading of the abstract is permitted for personal use only.
Gary DeVries and Paul E. Murphy "Balancing measurement time and uncertainty when stitching in production environments", Proc. SPIE 10316, Optifab 2007: Technical Digest, 103160U (14 May 2007); https://doi.org/10.1117/12.719818
Advertisement
Advertisement
RIGHTS & PERMISSIONS
Get copyright permission  Get copyright permission on Copyright Marketplace
KEYWORDS
Time metrology

Environmental sensing

Calibration

Interferometers

Turbulence

Control systems

Polishing

Back to Top