Superresolution imaging in spatially multiplexed interferometric microscopy by using time multiplexing

Vicente Micó; José Ángel Picazo-Bueno; Zeev Zalevsky; Javier García; Carlos Ferreira

doi:10.1117/12.2270396

26 June 2017 Superresolution imaging in spatially multiplexed interferometric microscopy by using time multiplexing

Vicente Micó, José Ángel Picazo-Bueno, Zeev Zalevsky, Javier García, Carlos Ferreira

Proceedings Volume 10329, Optical Measurement Systems for Industrial Inspection X; 103294C (2017) https://doi.org/10.1117/12.2270396
Event: SPIE Optical Metrology, 2017, Munich, Germany

Abstract

We report on the merging between our recently introduced SMIM (initials incoming from Spatially-Multiplexed Interferometric Microscopy) technique and superresolution imaging. SMIM has been previously reported [Opt. Express 22, 14929 (2014); J. Bio. Opt. 21, 106007 (2016)] as a low cost, extremely simple, and highly stable scheme to update a standard microscope into a holographic microscope but, as consequence, the usable FOV is reduced. Superresolution capability enables to enhance the resolution limit in the usable FOV thus compensating the FOV reduction. In this contribution, superresolution is implemented joint together with SMIM defining a new method named as S2MIM (initials incoming from Superresolved Spatially Multiplexed Interferometric Microscopy) which updates a commercially available non-holographic microscope into a superresolved holographic one. Experimental validation is presented for an Olympus BX-60 upright microscope with a USAF resolution test target as calibration object.

Citation Download Citation

Vicente Micó, José Ángel Picazo-Bueno, Zeev Zalevsky, Javier García, and Carlos Ferreira "Superresolution imaging in spatially multiplexed interferometric microscopy by using time multiplexing", Proc. SPIE 10329, Optical Measurement Systems for Industrial Inspection X, 103294C (26 June 2017); https://doi.org/10.1117/12.2270396

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KEYWORDS

Microscopes

Super resolution

Multiplexing

Holography

Interferometry

Microscopy

Objectives

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