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26 June 2017 A high-speed full-field profilometry with coded laser strips projection
Guanliang Zhang, Xiang Zhou, Rui Jin, Changda Xu, Dong Li
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Proceedings Volume 10329, Optical Measurement Systems for Industrial Inspection X; 103294W (2017) https://doi.org/10.1117/12.2278907
Event: SPIE Optical Metrology, 2017, Munich, Germany
Abstract
Line structure light measurement needs accurate mechanical movement device and high -frame-rate camera, which is difficult to realize. We propose a high-speed full-field profilometry to solve these difficult ies, using coded laser strips projected by a MEMS scanning mirror. The mirror could take place of the mechanical movement device with its high speed and accurate. Besides, a method with gray code and color code is used to decrease the frames number of projection, retaining the advantage of line structure light measurement. In the experiment, we use a laser MEMS scanner and two color cameras. The laser MEMS scanner projects coded stripes, with two color cameras collecting the modulated pattern on the measured object. The color cameras compose a stereo vision system so that the three-dimensional data is reconstructed according to triangulation.
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Guanliang Zhang, Xiang Zhou, Rui Jin, Changda Xu, and Dong Li "A high-speed full-field profilometry with coded laser strips projection", Proc. SPIE 10329, Optical Measurement Systems for Industrial Inspection X, 103294W (26 June 2017); https://doi.org/10.1117/12.2278907
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KEYWORDS
Laser scanners
3D scanning
Binary data
Stereo vision systems
Image compression
Structured light
Biomedical optics
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