Paper
18 November 1989 Far-Infrared Detector Using BaPb0.7Bi0.3O3 Thin Film Josephson Element.
A. Sawada, X . Sato, Y. Enomoto, T. Murakami
Author Affiliations +
Proceedings Volume 1039, 13th Intl Conf on Infrared and Millimeter Waves; (1989) https://doi.org/10.1117/12.978537
Event: 13th International Conference on Infrared and Millimeter Waves, 1987, Honolulu, HI, United States
Abstract
A new detector using BaPb0.7 Bi0.3 03 thin film Josephson element has been found to detect far-infrared light in the range of wavelength from 50μ to 500μ (wavenumber from 200 cm -1 to 20 cm -1). The optimum conditions are searched by changing the temperature of the element, the bias current through the element, and the chopping frequency of incident light.
© (1989) COPYRIGHT Society of Photo-Optical Instrumentation Engineers (SPIE). Downloading of the abstract is permitted for personal use only.
A. Sawada, X . Sato, Y. Enomoto, and T. Murakami "Far-Infrared Detector Using BaPb0.7Bi0.3O3 Thin Film Josephson Element.", Proc. SPIE 1039, 13th Intl Conf on Infrared and Millimeter Waves, (18 November 1989); https://doi.org/10.1117/12.978537
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KEYWORDS
Sensors

Signal detection

Thin films

Amplifiers

Capacitance

Infrared radiation

Spectroscopy

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