Paper
2 June 1989 Infrared Fiber Evanescent Wave Spectroscopy For In-Situ Monitoring Of Chemical Processes
E. Margalit, H. Dodiuk, E. M. Kosower, A. Katzir
Author Affiliations +
Proceedings Volume 1048, Infrared Fiber Optics; (1989) https://doi.org/10.1117/12.951395
Event: OE/LASE '89, 1989, Los Angeles, CA, United States
Abstract
A silver halide infrared fiber-optic evanescent wave spectroscopic technique for in-situ monitoring of chemical processes and surface analysis is described. Samples are spread onto a fiber contained in a teflon-lined cell. Attenuated total internal reflectance (AIR) measurement with a Fourier transform infrared (FTIR) spectrometer yields spectra at various stages of a process (for example, the monitoring of adhesive curing and coupling agent polymerization). Changes in known spectroscopic features may be recognized in films as thin as a monolayer. The advantages and limitations of this surface analysis technique are discussed.
© (1989) COPYRIGHT Society of Photo-Optical Instrumentation Engineers (SPIE). Downloading of the abstract is permitted for personal use only.
E. Margalit, H. Dodiuk, E. M. Kosower, and A. Katzir "Infrared Fiber Evanescent Wave Spectroscopy For In-Situ Monitoring Of Chemical Processes", Proc. SPIE 1048, Infrared Fiber Optics, (2 June 1989); https://doi.org/10.1117/12.951395
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Cited by 12 scholarly publications.
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KEYWORDS
Spectroscopy

Infrared radiation

Infrared spectroscopy

Chemical reactions

FT-IR spectroscopy

Thin films

Absorption

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