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21 November 2017 Investigation of UV laser induced depositions on optics under space conditions in presence of outgassing materials
Helmut Schröder, Wolfgang Riede, Hamid Kheyrandish, Denny Wernham, Yngve Lien
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Proceedings Volume 10567, International Conference on Space Optics — ICSO 2006; 1056738 (2017) https://doi.org/10.1117/12.2308066
Event: International Conference on Space Optics 2006, 2006, Noordwijk, Netherlands
Abstract
We have investigated the formation of UV laser induced deposits on uncoated fused silica optics under simulated space conditions in presence of outgassing materials at 30°C and 100°C. We used a frequency tripled Nd:YAG laser with 355 nm wavelength, 3 ns pulse length and 100 Hz repetition rate. Optics were exposed to fluence values in the range of 0.5 – 1.0 J/cm2. As contamination samples epoxy, silicone and polyurethane containing materials were used. The depositions were monitored online and in-situ by measuring the fluorescence intensity distribution with CCD cameras, where the UV laser beam itself served as excitation source for fluorescence emission. This method allows for a very sensitive detection of the onset of deposit formation. Contaminant layers with a thickness down to 20 nm can be consistently detected. The influence of water on the formation of deposits was investigated. Time-of-flight secondary ion mass spectroscopy (ToFSIMS) was used for chemical characterization of the deposits.
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Helmut Schröder, Wolfgang Riede, Hamid Kheyrandish, Denny Wernham, and Yngve Lien "Investigation of UV laser induced depositions on optics under space conditions in presence of outgassing materials", Proc. SPIE 10567, International Conference on Space Optics — ICSO 2006, 1056738 (21 November 2017); https://doi.org/10.1117/12.2308066
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Cited by 2 scholarly publications and 2 patents.
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KEYWORDS
Luminescence
Epoxies
Ultraviolet radiation
Astronomical imaging
Contamination
Polyurethane
Silicon
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