Analysis of Fourier ptychographic microscopy with half reduced images

Ao Zhou; Ni Chen; Guohai Situ

doi:10.1117/12.2287075

12 January 2018 Analysis of Fourier ptychographic microscopy with half reduced images

Ao Zhou, Ni Chen, Guohai Situ

Proceedings Volume 10620, 2017 International Conference on Optical Instruments and Technology: Optoelectronic Imaging/Spectroscopy and Signal Processing Technology; 1062011 (2018) https://doi.org/10.1117/12.2287075
Event: International Conference on Optical Instruments and Technology 2017, 2017, Beijing, China

Abstract

Fourier ptychography microscopy (FPM) provides gigapixel imaging with both a high image resolution and a wide field-of-view (FOV). However, it is time consuming during the image capture process. In this paper, we perform an analysis on the FPM imaging process. With numerical and experimental comparison, we find that the reconstructed high resolution images with half number of the total captured images is less degenerated compare to that using all the captured images, especially in the case that the object is amplitude or phase-only.

Citation Download Citation

Ao Zhou, Ni Chen, and Guohai Situ "Analysis of Fourier ptychographic microscopy with half reduced images", Proc. SPIE 10620, 2017 International Conference on Optical Instruments and Technology: Optoelectronic Imaging/Spectroscopy and Signal Processing Technology, 1062011 (12 January 2018); https://doi.org/10.1117/12.2287075

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