Sensor-side Brownian noise reduction in optically trapped probe microscopy

Thomas F. Dixon; Peter Reece

doi:10.1117/12.2320850

7 September 2018 Sensor-side Brownian noise reduction in optically trapped probe microscopy

Thomas F. Dixon, Peter Reece

Proceedings Volume 10723, Optical Trapping and Optical Micromanipulation XV; 107232F (2018) https://doi.org/10.1117/12.2320850
Event: SPIE Nanoscience + Engineering, 2018, San Diego, California, United States

Abstract

Optically Trapped Probe Microscopy (OTPM) is an emerging imaging technique using optically trapped objects as near-field probes, able to sense a variety of local effects by utilizing different probe materials and geometries. However, the quest for super-resolution in OTPM presents an almost insurmountable barrier; the ever-present stochastic Brownian motion of the trapped object, which serves to geometrically broaden the acquired signal and degrade resolving capacity. A reduction of Brownian motion can be achieved through active trap control or increased laser power, but these approaches carry increased system costs and complexities, or could jeopardize the life-safe nature of IR optical trap experiments. In this poster, we present a post-processing solution to the Brownian motion problem; by splitting measurements into microsecond-length integrations and simultaneously measuring the position of the trapped probe, deconvolution of the effect of Brownian motion on transmitted signal is possible. We conduct an experimental and simulated investigation into this post-processing, and are able to reduce the noise and increase resolution of a variety of excitation patterns in a trapped nanodiamond fluorescence microscope.

Citation Download Citation

Thomas F. Dixon and Peter Reece "Sensor-side Brownian noise reduction in optically trapped probe microscopy", Proc. SPIE 10723, Optical Trapping and Optical Micromanipulation XV, 107232F (7 September 2018); https://doi.org/10.1117/12.2320850

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