Paper
6 November 2018 Accuracy evaluations of axial localisation algorithms in confocal microscopy
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Abstract
The localisation accuracy of axial peaks is an important factor for height determination in a confocal microscope. Several algorithms have been proposed for height extraction in surface topography measurements. However, some algorithms ignore the influence of error and discrete sampling on the accuracy. This paper analyzes the localisation accuracy of some common algorithms under different aberrations and random errors, and discusses the effect of axial scanning interval on the accuracy of each algorithm. Finally, we get the application scope of each algorithm. Our results offer a reference for selecting algorithms for confocal metrology.
© (2018) COPYRIGHT Society of Photo-Optical Instrumentation Engineers (SPIE). Downloading of the abstract is permitted for personal use only.
Rongjun Shao, Weiqian Zhao, Lirong Qiu, Yun Wang, and Ruirui Zhang "Accuracy evaluations of axial localisation algorithms in confocal microscopy", Proc. SPIE 10819, Optical Metrology and Inspection for Industrial Applications V, 108191O (6 November 2018); https://doi.org/10.1117/12.2501031
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Cited by 1 scholarly publication.
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KEYWORDS
Confocal microscopy

Monochromatic aberrations

Signal to noise ratio

Error analysis

Interference (communication)

Metrology

Sensors

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