Ratiometric wavelength monitor based on Mach-Zehnder interferometer over a 80nm wavelength range

Hui Zhao; Guangyi Song; Shuxin Wang; Tingting Lang; Jianjun He

doi:10.1117/12.2505121

12 December 2018 Ratiometric wavelength monitor based on Mach-Zehnder interferometer over a 80nm wavelength range

Hui Zhao, Guangyi Song, Shuxin Wang, Tingting Lang, Jianjun He

Proceedings Volume 10847, Optical Precision Manufacturing, Testing, and Applications; 108470I (2018) https://doi.org/10.1117/12.2505121
Event: International Symposium on Optoelectronic Technology and Application 2018, 2018, Beijing, China

Abstract

In this paper, a ratiometric wavelength monitor at around 1550 nm based on the passive Silicon-on-Insulator (SOI) integrated device is proposed, theoretically investigated and fabricated. This monitor is made of a single Mach-Zehnder Interferometer (MZI) with direction coupler acting as edge filter. The ouput spectral response is designed to be ‘X-type’. The device shows a resolution of better than 0.4 nm over the wavelength range from 1505 nm to 1585 nm with a discrimination range of 30.5 dB from 15.5 dB to -15dB, which is suitable for wavelength measurement. Based on the single mode principle, the waveguide has a 220 nm×500 nm cross section for TM-polarized mode, and the total chip size is only 18 um×20 um. In conclusion, this proposed ratiometric wavelength monitor based on a single Mach-Zehnder Interferometer on SOI platform can realize the excellent resolution over large wavelength range.

Citation Download Citation

Hui Zhao, Guangyi Song, Shuxin Wang, Tingting Lang, and Jianjun He "Ratiometric wavelength monitor based on Mach-Zehnder interferometer over a 80nm wavelength range", Proc. SPIE 10847, Optical Precision Manufacturing, Testing, and Applications, 108470I (12 December 2018); https://doi.org/10.1117/12.2505121

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