Expert System for ASIC Imaging

Shri N. Gupta; Khalil I. Arshak; Pearse McDonnell; Conor Boyce; Andrew Duggan

doi:10.1117/12.953157

25 July 1989 Expert System for ASIC Imaging

Shri N. Gupta, Khalil I. Arshak, Pearse McDonnell, Conor Boyce, Andrew Duggan

Proceedings Volume 1088, Optical/Laser Microlithography II; (1989) https://doi.org/10.1117/12.953157
Event: 1989 Santa Clara Symposium on Microlithography, 1989, San Jose, CA, United States

Abstract

With the developments in the techniques of artificial intelligence over the last few years, development of advisory, scheduling and similar class of problems has become very convenient using tools such as PROLOG. In this paper an expert system has been described which helps lithographers and process engineers in several ways. The methodology used is to model each work station according to its input, output and control parameters, combine these work stations in a logical sequence based on past experience and work out process schedule for a job. In addition, all the requirements vis-a-vis a particular job parameters are converted into decision rules. One example is the exposure time, develop time for a wafer with different feature sizes would be different. This expert system has been written in Turbo Prolog. By building up a large number of rules, one can tune the program to any facility and use it for as diverse applications as advisory help, trouble shooting etc. Leitner (1) has described an advisory expert system that is being used at National Semiconductor. This system is quite different from the one being reported in the present paper. The approach is quite different for one. There is stress on job flow and process for another.

Citation Download Citation

Shri N. Gupta, Khalil I. Arshak, Pearse McDonnell, Conor Boyce, and Andrew Duggan "Expert System for ASIC Imaging", Proc. SPIE 1088, Optical/Laser Microlithography II, (25 July 1989); https://doi.org/10.1117/12.953157

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