X-ray computed tomography instrument performance evaluation: Detecting geometry errors using a calibrated artifact

Bala Muralikrishnan; Meghan Shilling; Steve Phillips; Wei Ren; Vincent Lee; Felix Kim; Gabriel Alberts; Valentina Aloisi

doi:10.1117/12.2518108

13 May 2019 X-ray computed tomography instrument performance evaluation: Detecting geometry errors using a calibrated artifact

Bala Muralikrishnan, Meghan Shilling, Steve Phillips, Wei Ren, Vincent Lee, Felix Kim, Gabriel Alberts, Valentina Aloisi

Author Affiliations +

Proceedings Volume 10991, Dimensional Optical Metrology and Inspection for Practical Applications VIII; 109910R (2019) https://doi.org/10.1117/12.2518108
Event: SPIE Defense + Commercial Sensing, 2019, Baltimore, MD, United States

Abstract

X-ray computed tomography (XCT) is uniquely suitable for non-destructive dimensional measurements of delicate or internal features produced, for example, by additive manufacturing. While XCT has long been used in medical imaging, it has been used for industrial dimensional measurements only in recent years. The error sources in XCT of industrial components is still a topic of active research. One subgroup of potential error sources in XCT measurements are uncorrected XCT instrument geometry errors, such as detector misalignment or rotation stage errors, and are the focus of this paper. We demonstrate the effect of some instrument geometry errors on measurements performed on a calibrated artifact and compare the results to those obtained through simulations. The overall objective of this work is to support ongoing efforts to develop documentary national and international standards for performance evaluations of XCT instruments. In this study, we focus on cone-beam XCT instruments.

Conference Presentation

Citation Download Citation

Bala Muralikrishnan, Meghan Shilling, Steve Phillips, Wei Ren, Vincent Lee, Felix Kim, Gabriel Alberts, and Valentina Aloisi "X-ray computed tomography instrument performance evaluation: Detecting geometry errors using a calibrated artifact", Proc. SPIE 10991, Dimensional Optical Metrology and Inspection for Practical Applications VIII, 109910R (13 May 2019); https://doi.org/10.1117/12.2518108

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