Presentation + Paper
24 April 2019 Higher order modes at FELs: a machine interpretation
Peihao Sun, Yanwen Sun, Diling Zhu, Sanghoon Song, Haoyuan Li, Matthieu Chollet, Matthew Seaberg, Jerome B. Hastings, Aymeric Robert, Mark Sutton, Yiping Feng
Author Affiliations +
Abstract
In X-ray Free-Electron Lasers (FELs), intense and coherent pulses are generated via amplification of the undulator radiation from micro-bunched electron pulses. The initial radiation is spontaneous and intrinsically stochastic, thus causing shot-to-shot fluctuations in the intensity, pointing, and spatiotemporal profile of the X-ray beam. In this work, we use deep neural networks to investigate the fluctuations in X-ray beam profiles, thereby obtaining statistical information on the lasing process. A supervised model was built to classify X-ray images, and an unsupervised one to study the distribution of beam profiles. We have found that round-shaped profiles appear more often with increasing monochromator bandwidth, suggesting that some round-shaped images can be superpositions of higher-order modes. Our results also suggest that the X-ray beam continues to evolve past the FEL saturation length towards a round-shaped beam profile.
Conference Presentation
© (2019) COPYRIGHT Society of Photo-Optical Instrumentation Engineers (SPIE). Downloading of the abstract is permitted for personal use only.
Peihao Sun, Yanwen Sun, Diling Zhu, Sanghoon Song, Haoyuan Li, Matthieu Chollet, Matthew Seaberg, Jerome B. Hastings, Aymeric Robert, Mark Sutton, and Yiping Feng "Higher order modes at FELs: a machine interpretation", Proc. SPIE 11038, X-Ray Free-Electron Lasers: Advances in Source Development and Instrumentation V, 1103803 (24 April 2019); https://doi.org/10.1117/12.2522912
Lens.org Logo
CITATIONS
Cited by 1 scholarly publication.
Advertisement
Advertisement
RIGHTS & PERMISSIONS
Get copyright permission  Get copyright permission on Copyright Marketplace
KEYWORDS
X-rays

Free electron lasers

Stochastic processes

Electrons

X-ray imaging

X-ray lasers

Diagnostics

Back to Top