Paper
28 January 2019 Recent advances on in situ materials characterization using ultra high-speed x-ray imaging at The European Synchrotron – ESRF
Margie P. Olbinado, Alexander Rack
Author Affiliations +
Proceedings Volume 11051, 32nd International Congress on High-Speed Imaging and Photonics; 110510F (2019) https://doi.org/10.1117/12.2524607
Event: International Conference on High-Speed Imaging and Photonics 2018, 2018, Enschede, The Netherlands
Abstract
Mega-hertz (MHz) pulse repetition rates of intense x-ray flashes are characteristic to storage ring-based synchrotron light sources. When combined with an indirect x-ray image detection scheme composed of a fast-decay scintillator and an ultra high-speed CMOS camera, this allows multiple-frame tracking of transient processes in optically opaque objects. The temporal resolution of this so-called single-bunch imaging is ~100 ps, which is equivalent to the width of an electron bunch in the storage ring. A train of x-ray pulses can also be captured continuously (multiple-bunch imaging); the temporal resolution depends on the camera’s integration window and several hundred nanoseconds are frequently reached. At the European Synchrotron – ESRF, beamline ID19, single- and multiple-bunch x-ray imaging up to millions frames per second rates are now routinely performed within the user programme for various in situ materials characterization. In this presentation, we will describe our strategies to push the limits of time-resolved hard x-ray imaging at ESRF.
© (2019) COPYRIGHT Society of Photo-Optical Instrumentation Engineers (SPIE). Downloading of the abstract is permitted for personal use only.
Margie P. Olbinado and Alexander Rack "Recent advances on in situ materials characterization using ultra high-speed x-ray imaging at The European Synchrotron – ESRF", Proc. SPIE 11051, 32nd International Congress on High-Speed Imaging and Photonics, 110510F (28 January 2019); https://doi.org/10.1117/12.2524607
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KEYWORDS
X-rays

X-ray imaging

Synchrotrons

Hard x-rays

X-ray detectors

Cameras

Material characterization

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