Paper
7 March 2019 Equivalent thin film model with complex refractive index of resonant micromesh
Yongmeng Liu, Xv Liu , Zelin Li, Chuanzhi Sun , Enxiao Liu
Author Affiliations +
Proceedings Volume 11053, Tenth International Symposium on Precision Engineering Measurements and Instrumentation; 110534U (2019) https://doi.org/10.1117/12.2521224
Event: 10th International Symposium on Precision Engineering Measurements and Instrumentation (ISPEMI 2018), 2018, Kunming, China
Abstract
Resonant micromesh with a hexagonal periodic array of micrometer-sized circular apertures is an interesting alternative to non-resonant micromesh and has the potential for superior optical transmission, while providing adequate electromagnetic interference shielding for optical windows. This paper proposes an equivalent thin film model with complex refractive index for prediction of shielding effectiveness of resonant micromesh coating. Corrected equivalent reactance and sheet resistance are given considering the thickness and duty factor of resonant micromesh. And the effects on complex refractive index of resonant micromesh parameters are analyzed. The proposed equivalent thin film model can be used to evaluate shielding effectiveness of resonant micromesh coating for optical windows.
© (2019) COPYRIGHT Society of Photo-Optical Instrumentation Engineers (SPIE). Downloading of the abstract is permitted for personal use only.
Yongmeng Liu, Xv Liu , Zelin Li, Chuanzhi Sun , and Enxiao Liu "Equivalent thin film model with complex refractive index of resonant micromesh", Proc. SPIE 11053, Tenth International Symposium on Precision Engineering Measurements and Instrumentation, 110534U (7 March 2019); https://doi.org/10.1117/12.2521224
Advertisement
Advertisement
RIGHTS & PERMISSIONS
Get copyright permission  Get copyright permission on Copyright Marketplace
KEYWORDS
Resistance

Coating

Refractive index

Thin films

Electromagnetic coupling

Transmittance

Metals

Back to Top