Non-destructive and real-time optical inspection for lens size using swept source optical coherence tomography

Pingping Jia; Hong Zhao II; Jinlei Zhao III; Meiqi Fang IV; Yuwei Qin V

doi:10.1117/12.2525974

21 June 2019 Non-destructive and real-time optical inspection for lens size using swept source optical coherence tomography

Pingping Jia, Hong Zhao II, Jinlei Zhao III, Meiqi Fang IV, Yuwei Qin V

Author Affiliations +

Proceedings Volume 11056, Optical Measurement Systems for Industrial Inspection XI; 110562C (2019) https://doi.org/10.1117/12.2525974
Event: SPIE Optical Metrology, 2019, Munich, Germany

Abstract

The SS-OCT system was constructed using a swept laser source and a compact Michelson interferometer. The outputs of sweep source include laser signal and k-trigger signal. The laser signal realizes spectral interference and the k-trigger signal realizes acquisition interferometer signal with uniformly wavenumber interval. However, there are two problems. The first one is that the output wavenumber of the source changes non-linear with time. To solve this problem, a wavenumber phase equalization algorithm is proposed. The second problem is that the unfixed delay between the spectral calibration signal k-trigger and the OCT signal, which makes the result of spectral calibration incorrectly. Aiming at the asynchronization between the acquire OCT signal and the k-trigger signal, an algorithm of k-clock delay correction based on cross correlation is adopted to correct the delay. The SS-OCT system could be used for accurate measurement the curvature of the laser focusing lens due to its excellent advantages such as non-destructive, high resolution and high inspection speed. The 2D tomography maps of a laser focusing lens are measured by this system and real-time images are obtained.

Citation Download Citation

Pingping Jia, Hong Zhao II, Jinlei Zhao III, Meiqi Fang IV, and Yuwei Qin V "Non-destructive and real-time optical inspection for lens size using swept source optical coherence tomography", Proc. SPIE 11056, Optical Measurement Systems for Industrial Inspection XI, 110562C (21 June 2019); https://doi.org/10.1117/12.2525974

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